Nishit Agarwal, Venkata Ramanaiah Chintha, Raja Kumar Kolli, Om Goel, Raghav Agarwal. Deep Learning for Real time EEG Artifact Detection in Wearables. JRPS [Internet]. 2022 Nov. 29 [cited 2024 Nov. 23];13(5):402-33. Available from: https://jrps.shodhsagar.com/index.php/j/article/view/1510