NISHIT AGARWAL; VENKATA RAMANAIAH CHINTHA; RAJA KUMAR KOLLI; OM GOEL; RAGHAV AGARWAL. Deep Learning for Real time EEG Artifact Detection in Wearables. International Journal for Research Publication and Seminar, [S. l.], v. 13, n. 5, p. 402–433, 2022. DOI: 10.36676/jrps.v13.i5.1510. Disponível em: https://jrps.shodhsagar.com/index.php/j/article/view/1510. Acesso em: 23 nov. 2024.