Nishit Agarwal, Venkata Ramanaiah Chintha, Raja Kumar Kolli, Om Goel, & Raghav Agarwal. (2022). Deep Learning for Real time EEG Artifact Detection in Wearables. International Journal for Research Publication and Seminar, 13(5), 402–433. https://doi.org/10.36676/jrps.v13.i5.1510